Abstract

Outlier screening is a popular approach employed for automotive product lines. There have been many outlier methods proposed. In practice, it is desirable to choose the “best” outlier method. This work develops a notion of applicability associated with an outlier method on a given set of wafers. A measure for applicability is proposed and experiment results are presented to illustrate its effects for finding outliers and for analyzing customer returns based on data collected from several automotive product lines.